TOF SIMS (Time Of Flight Secondary Ion Mass Spec.)

About the product
The TOF.SIMS 5 provides detailed elemental and molecular information about surface, thin layers, interfaces of the sample, and gives a full three-dimensional analysis. Its unique design guarantees optimum performance in all fields of SIMS applications. Characteristics: Parallel detection of all ions, organic & inorganic, Unlimited mass range, High Mass Resolution, High lateral & in-depth resolution, High sensitivity in the ppm/ppb range. Explore beyond limit.
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